DAC 2017 : Asia and South Pacific Design Automation Conference
Aims of the Conference:
ASP-DAC 2017 is the 22nd annual international conference on VLSI design automation in Asia and South Pacific regions, one of the most active regions of design and fabrication of silicon chips in the world. The conference aims at providing the Asian and South Pacific CAD/DA and Design community with opportunities of presenting recent advances and with forums for future directions in technologies related to Electronic Design Automation (EDA). The format of the meeting intends to cultivate and promote an instructive and productive interchange of ideas among EDA researchers/developers and system/circuit/device designers. All scientists, engineers, and students who are interested in theoretical and practical aspects of VLSI design and design automation are welcomed to ASP-DAC.
Areas of Interest:
Original papers in, but not limited to, the following areas are invited.
1. System-Level Modeling and Design Methodology:
1.1. HW/SW co-design, co-simulation and co-verification
1.2. System-level design exploration, synthesis and optimization
1.3. Model- and component-based embedded system/software design
1.4. System-level formal verification
1.5. System-level modeling, simulation and validation tools/methodology
2. Embedded System Architectures and Design:
2.1. Many- and multi-core SoC architecture
2.2. Reconfigurable and self-adaptive SoC architecture
2.3. IP/platform-based SoC design
2.4. Domain-specific architecture
2.5. Dependable architecture
2.6. On-chip memory architecture
2.7. Cyber physical system
2.8. Storage system architecture
2.9. Internet of things
3. On-chip Communication and Networks-on-Chip:
3.1. On-chip communication networks
3.2. Networks-on-chips
3.3. Interface and I/O design
3.4. Optical and RF on-chip communications
4. Embedded Software:
4.1. Kernel, middleware and virtual machine
4.2. Compiler and toolchain
4.3. Real-time system
4.4. Resource allocation for heterogeneous computing platform
4.5. Storage software and application
4.6. Human-computer interface
4.7. System verification and analysis
5. Device/Circuit-Level Modeling, Simulation and Verification:
5.1. Device/circuit/interconnect modeling and analysis
5.2. Device/circuit-level simulation tools and methodologies
5.3. RTL and gate-leveling modeling, simulation and verification
5.4. Circuit-level formal verification
6. Analog, RF and Mixed Signal:
6.1. Analog/mixed-signal/RF synthesis
6.2. Analog layout, verification and simulation techniques
6.3. Noise analysis
6.4. High-frequency electromagnetic simulation of circuit
6.5. Mixed-signal design consideration
6.6. Power-aware analog circuit/system design
6.7. Analog/mixed-signal modeling and simulation techniques
6.8. CAD for memory circuits
7. Cross-layer Power Analysis, Low Power Design, and Thermal Management:
7.1. Power modeling, analysis and simulation
7.2. Low-power design and methodology
7.3. Thermal aware design
7.4. Architectural low-power design technique
7.5. Energy harvesting and battery management
8. Logic/Behavioral/High-Level Synthesis and Optimization:
8.1. High-level synthesis tool and methodology
8.2. Combinational, sequential and asynchronous logic synthesis
8.3. Logic synthesis and physical design technique for FPGA
8.4. Technology mapping
9. Physical Design:
9.1. Floorplanning, partitioning and placement
9.2. Interconnect planning and synthesis
9.3. Placement and routing optimization
9.4. Clock network synthesis
9.5. Post layout and post-silicon optimization
9.6. Package/PCB/3D-IC routing
10. Design for Manufacturability and Reliability:
10.1. Reticle enhancement, lithography-related design and optimization
10.2. Resilience under manufacturing variation
10.3. Design for manufacturability, yield, and defect tolerance
10.4. Reliability, aging and soft error analysis
10.5. Design for reliability, aging, and robustness
11. Timing and Signal/Power Integrity:
11.1. Deterministic/statistical timing and performance analysis and optimization
11.2. Power/ground and package modeling, analysis and optimization
11.3. Signal/power integrity, EM modeling and analysis
11.4. Extraction, TSV and package modeling
11.5. 2D/3D on-chip power delivery network analysis and optimization
12. Test and Design for Testability:
12.1. ATPG, BIST and DFT
12.2. Fault modeling and simulation
12.3. System test and 3D IC test
12.4. Online test and fault tolerance
12.5. Memory test and repair
12.6. Analog and mixed-signal test
13. Security and Fault-Tolerant System:
13.1. Security modeling and analysis
13.2. Architectures, tools and methodologies for secure hardware
13.3. Design for security and security primitives
13.4. Cross-layer security
13.5. Fault analysis, detect and tolerance
14. Emerging Technology:
14.1. New transistor/device and process technology: spintronic, phase-change, single-electron etc.
14.2. CAD for nanotechnology, MEMS, 3D IC, quantum computing etc.
15. Emerging Application:
15.1. Biomedical application
15.2. Big data application
15.3. Advanced multimedia application
15.4. Energy-storage/smart-grid/smart-building design and optimization
15.5. Datacenter optimization
15.6. Automotive system design and optimization
15.7. Electromobility
ACM, IEEE, IEICE and IPSJ reserve the right to exclude a paper from distribution after the conference (e.g., removal from ACM Digital Library and IEEE Xplore) if the paper is not presented at the conference by the author of the paper. ASP-DAC does not allow double and/or parallel submissions of similar work to any other conferences, symposia, and journals.
Last updated by Dou Sun in 2016-05-08
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